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자료 필터
자료유형
발행연도
2003 ~ 2027
2003 2027
키워드
언어
선택된 필터
- conference
- article
- book
전체 110건 중 11번부터 20번까지의 결과를 표시합니다.
2026
Conference
Demonstration and optimization of 2T-nC FeRAM for multi-level compute-in-memory operation
- 2026-01-18
- 중국
Article
Innovative 3-D n-Capacitor-Stacked FeRAM With V DD/3 Inhibition Scheme and Cell Design for Nonvolatile DRAM Applications
- Kim, Ki Hoon ;
- You, Hyeok Jun ;
- Kang, Seung Min ;
- Kang, Hee Bum ;
- Kim, Sang Wan ;
- ... Kim, Si Hyun ;
- 외 1명
- 2026-01
- IEEE Transactions on Electron Devices
- Institute of Electrical and Electronics Engineers
2025
Article
Room Temperature Hydrogen Gas Sensor Based on Pd-SnO2 Nanomaterials with Electro-spinning
- Jang, Dong Jun ;
- Kim, Sang Wan ;
- Kwon, Min Woo
- 2025-12
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- 대한전자공학회
Article
Analysis of Transient Response of Negative Capacitance Field-Effect Transistor
- Lee, Dong Keun ;
- Go, Seungwon ;
- Park, Jae Yeon ;
- Noh, Hyungju ;
- Choi, Jiwoong ;
- ... Kim, Jangsaeng ;
- ... Kim, Sihyun ;
- ... Kim, Sangwan
- 2025-12
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
Novel Hybrid SRAM for Low-Power Application
- Ahn, Hyunho ;
- Lee, Dong Keun ;
- Go, Seungwon ;
- Kim, Jangsaeng ;
- Kim, Sihyun ;
- ... Kim, Sangwan
- 2025-11
- IEEE Electron Device Letters
- Institute of Electrical and Electronics Engineers
Article
Rigorous analysis on the operating mechanism of gate-injection ferroelectric flash
- Jeon, Yelim ;
- Noh, Hyung ju ;
- Go, Seung Won ;
- Kim, Sang Wan
- 2025-10
- Solid-State Electronics
- Pergamon Press Ltd.
Article
Impact of Al-doping on Ferroelectricity and Reliability of HfZrO Film Under High Temperature Annealing
- Kim, Seong geun ;
- Go, Seung won ;
- Kim, Si hyun ;
- Kim, Sang wan
- 2025-09
- IEEE Electron Device Letters
- Institute of Electrical and Electronics Engineers
Conference
Analysis of short-channel effect in staggered-bottom gate amorphous InGaZnO thin-film transistors
- 2025-08-19
- 대한민국
Conference
Analysis of channel-length-dependent positive gate-bias-induced instability in staggered bottom-gate amorphous InGaZnO thin-film transistors
- 2025-08-19
- 대한민국
Conference
Three-dimensional complementary field-effect-transistor modeling and structural optimization
- 2025-07-13
- 대한민국