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자료 필터
자료유형
발행연도
2003 ~ 2027
2003 2027
키워드
언어
선택된 필터
- conference
- article
- book
전체 110건 중 1번부터 10번까지의 결과를 표시합니다.
2027
Article
Enhanced thermal robustness of laminated Hf0.5Zr0.5O2 ferroelectric film via Al2O3 mid-layer engineering
- Kim, Seonggeun ;
- Go, Seungwon ;
- Kim, Jangsaeng ;
- Kim, Sihyun ;
- Kim, Sangwan
- 2027-01
- Applied Surface Science
- ELSEVIER
2026
Article
Impact of Drain Bias on Degradation of Amorphous-InGaZnO Thin-Film Transistors
- Jang, Jaewon ;
- Kye, Yun Seok ;
- Go, Seungwon ;
- Park, Sooyoung ;
- Park, Hyun Sung ;
- ... Kim, Sangwan ;
- 외 2명
- 2026-09
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Remote Oxygen Scavenging in MFIS Gate Stack With Laminated HfZrO Film
- Kim, Seonggeun ;
- Jung, Jinhwan ;
- Kim, Jangsaeng ;
- Kim, Sihyun ;
- Kim, Sangwan
- 2026-09
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Vertical FerroelectricMetal Field-Effect Transistor (V-FeMFET) With Channel-All-Around (CAA) Structure
- Kang, Heebum ;
- Kang, Seungmin ;
- Kim, Kihoon ;
- Han, Jiwon ;
- Kim, Minseok ;
- ... Kim, Sangwan ;
- ... Kim, Sihyun ;
- 외 1명
- 2026-04
- IEEE Transactions on Electron Devices
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
High-speed monolithic 3D ternary CMOS design with junctionless FETs
- Ahn, Hyunho ;
- Han, Jiwon ;
- Kim, Sihyun ;
- Kim, Jang Hyun ;
- Kim, Sangwan
- 2026-03
- Semiconductor Science and Technology
- IOP Publishing Ltd
Article
Non-destructive read 1T-DRAM with p-n junction gate for overcoming scaling limitations
- Hwang, Eungi ;
- Lee, Jun ;
- Kim, Jang Hyun ;
- Kim, Sangwan ;
- Myeong, Ilho ;
- 외 1명
- 2026-02
- AIP Advances
- AIP Publishing
Conference
Investigation of instability in IGZO TFTs under pulsed positive bias illumination stress
- 2026-01-19
- 대한민국
Conference
Investigation of instability in IGZO TFTs under pulsed negative bias illumination stress
- 2026-01-19
- 대한민국
Conference
Reconfigurable binary and ternary CMOS NAND/NOR logic gates using monolithic 3D junctionless FET
- 2026-01-18
- 중국
Conference
Work-function variation effects on gate-injection ferroelectric FET (GI-FeFET)
- 2026-01-18
- 중국