상세 보기
Analysis of channel-length-dependent positive gate-bias-induced instability in staggered bottom-gate amorphous InGaZnO thin-film transistors
- 제목
- Analysis of channel-length-dependent positive gate-bias-induced instability in staggered bottom-gate amorphous InGaZnO thin-film transistors
- 저자
- 김상완
- 발행일
- 2025-08-19
- 학회명
- INTERNATIONAL MEETING ON INFORMATION DISPLAY (IMID)