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김상완 프로필 사진

김상완

Kim, Sangwan

공과대학

전자공학과

2007

2026

연도별 연구 활동 현황

전체 110건 중 1번부터 10번까지의 결과를 표시합니다.

2027

Article

Enhanced thermal robustness of laminated Hf0.5Zr0.5O2 ferroelectric film via Al2O3 mid-layer engineering

2026

Article

Impact of Drain Bias on Degradation of Amorphous-InGaZnO Thin-Film Transistors

Article

Remote Oxygen Scavenging in MFIS Gate Stack With Laminated HfZrO Film

Article

Vertical FerroelectricMetal Field-Effect Transistor (V-FeMFET) With Channel-All-Around (CAA) Structure

Article

High-speed monolithic 3D ternary CMOS design with junctionless FETs

Article

Non-destructive read 1T-DRAM with p-n junction gate for overcoming scaling limitations

Conference

Investigation of instability in IGZO TFTs under pulsed positive bias illumination stress

Conference

Investigation of instability in IGZO TFTs under pulsed negative bias illumination stress

Conference

Reconfigurable binary and ternary CMOS NAND/NOR logic gates using monolithic 3D junctionless FET

Conference

Work-function variation effects on gate-injection ferroelectric FET (GI-FeFET)

상세 보기

김상완

자료유형

발행연도

키워드

언어

Enhanced thermal robustness of laminated Hf0.5Zr0.5O2 ferroelectric film via Al2O3 mid-layer engineering

Impact of Drain Bias on Degradation of Amorphous-InGaZnO Thin-Film Transistors

Remote Oxygen Scavenging in MFIS Gate Stack With Laminated HfZrO Film

Vertical FerroelectricMetal Field-Effect Transistor (V-FeMFET) With Channel-All-Around (CAA) Structure

High-speed monolithic 3D ternary CMOS design with junctionless FETs

Non-destructive read 1T-DRAM with p-n junction gate for overcoming scaling limitations

Investigation of instability in IGZO TFTs under pulsed positive bias illumination stress

Investigation of instability in IGZO TFTs under pulsed negative bias illumination stress

Reconfigurable binary and ternary CMOS NAND/NOR logic gates using monolithic 3D junctionless FET

Work-function variation effects on gate-injection ferroelectric FET (GI-FeFET)