One-Ferroelectric-Tunnel-FET-Based Reconfigurable Logic Gates

  • Yeom, Jaemin
  • Ryu, Minjeong
  • Woo, Jae Seung
  • Lee, Jin Wook
  • Kim, Seonggeun
  • ... Kim, Sangwan
  • 외 2명
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초록

A novel reconfigurable logic gate (RLG) utilizing one ferroelectric tunnel field-effect transistor (FeTFET) is proposed for the first time. By leveraging the symmetric ambipolar current of the TFET and the minor loop behavior of the ferroelectric, NAND/OR/XNOR/IMP/RIMP operations are performed within a single FeTFET, enabling logic-in-memory (LiM) with high area efficiency. It is demonstrated that two inputs can be programmed in two steps, and the type of logic operation can be changed by simply altering the read voltage. The proposed FeTFET-based RLGs consume >99% lower operation energy than FeFET-based ones.

키워드

LogicLogic gatesFeFETsVoltageReconfigurable logicTFETsLogic arraysJunctionsTunnelingSilicon-on-insulatorFerroelectric tunnel FET (FeTFET)logic-in-memory (LiM)reconfigurable logic gate (RLG)OPERATIONS
제목
One-Ferroelectric-Tunnel-FET-Based Reconfigurable Logic Gates
저자
Yeom, JaeminRyu, MinjeongWoo, Jae SeungLee, Jin WookKim, SeonggeunGo, SeungwonKim, SangwanChoi, Woo Young
DOI
10.1109/TED.2025.3561710
발행일
2025-06
유형
Article
저널명
IEEE Transactions on Electron Devices
72
6
페이지
3302 ~ 3306