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One-Ferroelectric-Tunnel-FET-Based Reconfigurable Logic Gates
- Yeom, Jaemin;
- Ryu, Minjeong;
- Woo, Jae Seung;
- Lee, Jin Wook;
- Kim, Seonggeun;
- ... Kim, Sangwan;
- 외 2명
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1초록
A novel reconfigurable logic gate (RLG) utilizing one ferroelectric tunnel field-effect transistor (FeTFET) is proposed for the first time. By leveraging the symmetric ambipolar current of the TFET and the minor loop behavior of the ferroelectric, NAND/OR/XNOR/IMP/RIMP operations are performed within a single FeTFET, enabling logic-in-memory (LiM) with high area efficiency. It is demonstrated that two inputs can be programmed in two steps, and the type of logic operation can be changed by simply altering the read voltage. The proposed FeTFET-based RLGs consume >99% lower operation energy than FeFET-based ones.
키워드
Logic; Logic gates; FeFETs; Voltage; Reconfigurable logic; TFETs; Logic arrays; Junctions; Tunneling; Silicon-on-insulator; Ferroelectric tunnel FET (FeTFET); logic-in-memory (LiM); reconfigurable logic gate (RLG); OPERATIONS
- 제목
- One-Ferroelectric-Tunnel-FET-Based Reconfigurable Logic Gates
- 저자
- Yeom, Jaemin; Ryu, Minjeong; Woo, Jae Seung; Lee, Jin Wook; Kim, Seonggeun; Go, Seungwon; Kim, Sangwan; Choi, Woo Young
- 발행일
- 2025-06
- 유형
- Article
- 권
- 72
- 호
- 6
- 페이지
- 3302 ~ 3306