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Investigation on electron back tunneling effect in charge trap flash memory with SiO2-Si3N4 (ON) gate dielectric
- 제목
- Investigation on electron back tunneling effect in charge trap flash memory with SiO2-Si3N4 (ON) gate dielectric
- 저자
- 김상완
- 발행일
- 2024-01-30
- 학회명
- INTERNATIONAL CONFERENCE ON ELECTRONICS, INFORMATION AND CONFERENCE (ICEIC) 2024