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Investigation of the memory characteristics in the gate-injection ferroelectric metal/oxide/semiconductor (MOS) capacitors
- 제목
- Investigation of the memory characteristics in the gate-injection ferroelectric metal/oxide/semiconductor (MOS) capacitors
- 저자
- 김상완
- 발행일
- 2024-07-08
- 학회명
- ASIA-PACIFIC WORKSHOP ON ADVANCED SEMICONDUCTOR DEVICES (AWAD)