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Analysis of hump characteristics induced by band-to-band tunneling in floating-body n-MOSFET with ultra-shallow source/drain junction depth
- 제목
- Analysis of hump characteristics induced by band-to-band tunneling in floating-body n-MOSFET with ultra-shallow source/drain junction depth
- 저자
- 김상완
- 발행일
- 2024-07-08
- 학회명
- ASIA-PACIFIC WORKSHOP ON ADVANCED SEMICONDUCTOR DEVICES (AWAD)