Post-annealing effect on the interface morphology and current efficiency of organic light-emitting diodes

Yoon, Youngwoon; Lee, Hanju; Kim, Taedong; Kim, Kyoungchul; Choi, Sula; Yoo, Hyung Keun; Friedman, Barry; Lee, Kiejin

doi:10.1016/j.sse.2012.07.016

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Post-annealing effect on the interface morphology and current efficiency of organic light-emitting diodes

Yoon, Youngwoon;
Lee, Hanju;
Kim, Taedong;
Kim, Kyoungchul;
Choi, Sula;
외 3명

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초록

We studied the post annealing effect on the interface morphology and performance of organic light-emitting diodes (OLEDs) at 80 degrees C substrate temperature. We observed the crystallinity and roughness changes of each layer in an OLED with ITO/CuPc/NPB/Alq(3)/Al structure at various heat-treatment steps by X-ray diffraction (XRD) and atomic force microscopy (AFM). The roughness changes of each layer affected the current-voltage-luminance (IVL) characteristics of the OLEDs. The best annealing step with the best current efficiency was the sample with annealing at 80 degrees C for 2 h after the deposition of all organic layers. (C) 2012 Elsevier Ltd. All rights reserved.

키워드

OLED; Organic; Morphology; Annealing; THIN-FILMS; THERMAL-TREATMENT; DEVICES; LAYER; PERFORMANCE; TEMPERATURE; GROWTH

제목: Post-annealing effect on the interface morphology and current efficiency of organic light-emitting diodes

저자: Yoon, Youngwoon; Lee, Hanju; Kim, Taedong; Kim, Kyoungchul; Choi, Sula; Yoo, Hyung Keun; Friedman, Barry; Lee, Kiejin

DOI: 10.1016/j.sse.2012.07.016

발행일: 2013-01

유형: Article

저널명: Solid-State Electronics

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