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Surface Tension of Micellar Block Copolymer Films
- Lee, Heeju;
- Li, Xiaolong;
- Kim, Hyunjung;
- Jiang, Zhang;
- Lim, Jung-Ran;
- 외 1명
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1초록
Surface tensions of micellar block copolymers of poly(styrene-b-dimethylsiloxane) (PS-b-PDMS) films are obtained by X-ray diffuse scattering. PS-b-PDMS films on Si substrates with the thicknesses from 36 to 588 nm were investigated at temperatures of 30 - 215 degrees C. The surface tension reflects the concentration of PDMS micelles which are preferably located at the surface. The molar fraction of PDMS micelles near the surface is estimated by using angle-resolved X-ray photoelectron spectroscopy.
키워드
Surface tension; Polymer surface; X-ray diffuse scattering; Angle-resolved X-ray photoelectron spectroscopy; X-RAY; NEUTRON
- 제목
- Surface Tension of Micellar Block Copolymer Films
- 저자
- Lee, Heeju; Li, Xiaolong; Kim, Hyunjung; Jiang, Zhang; Lim, Jung-Ran; Lee, Jouhahn
- 발행일
- 2010-12
- 유형
- Article
- 권
- 57
- 호
- 6
- 페이지
- 1412 ~ 1415