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Investigation of the memory characteristics in the gate-injection ferroelectric metal/oxide/semiconductor (MOS) capacitors
- 제목
- Investigation of the memory characteristics in the gate-injection ferroelectric metal/oxide/semiconductor (MOS) capacitors
- 저자
- 김시현
- 발행일
- 2024-07-09
- 학회명
- 2024 ASIA-PACIFIC WORKSHOP ON ADVANCED SEMICONDUCTOR DEVICES (AWAD 2024)