K-Critical Path Search Based Multi corner Multi mode Static Timing Analysis

  • Oh, Deokkeun
  • Park, Eunsuk
  • Jin, Myeoungwoo
  • Kim, Juho
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초록

As CMOS technologies are scaled down into the nanometer range, effects of process variation have increased. Finding a critical path is important for performance and optimization of circuit. In this paper, we proposed efficient K-critical path detection in Multi Corner Multi Mode Static Timing Analysis(MCMM STA). We analyzed the characteristic of circuit and used MCMM timing model for considering various corners and modes. Using this timing model and pruning method, we can find more efficiently K-critical paths than traditional STA.

키워드

process variationcritical pathstatic timing analysispruuning methodMCMM
제목
K-Critical Path Search Based Multi corner Multi mode Static Timing Analysis
저자
Oh, DeokkeunPark, EunsukJin, MyeoungwooKim, Juho
DOI
10.1109/ISOCC.2014.7087611
발행일
2015-04-16
유형
Proceedings Paper
저널명
2014 INTERNATIONAL SOC DESIGN CONFERENCE (ISOCC)
페이지
212 ~ 213