Investigation of the Photovoltaic Effect in Solar Cells by Using a Near-field Microwave Microscope

초록

A near-field microwave microscope (NFMM) technique has been used to investigate the photovoltaic effect in solar cells. By measuring the reflection coefficient Si, at an operating frequency near 4.1 GHz, we could observe the photoconductivity changes inside the solar cells. The photoconductivity of the n-type silicon layer in a solar cell increased as the incident light's intensity was increased clue to the carrier motion through the pn junction. The photoconductivity also varied with the incident light's wavelength. We found good agreement between the variations in the microwave reflection coefficient Si, and the IV characteristics of solar cells for different incidentlight intensities and wavelengths.

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