Resonant X-ray emission spectroscopy using self-seeded hard X-ray pulses at PAL-XFEL

  • Choi, Tae-Kyu
  • Park, Jaeku
  • Kim, Gyujin
  • Jang, Hoyoung
  • Park, Sang-Youn
  • ... Kim, Hyunjung
  • 외 5명
Citations

WEB OF SCIENCE

6
Citations

SCOPUS

7

초록

Self-seeded hard X-ray pulses at PAL-XFEL were used to commission a resonant X-ray emission spectroscopy experiment with a von Hamos spectrometer. The self-seeded beam, generated through forward Bragg diffraction of the [202] peak in a 100 mu m-thick diamond crystal, exhibited an average bandwidth of 0.54 eV at 11.223 keV. A coordinated scanning scheme of electron bunch energy, diamond crystal angle and silicon monochromator allowed us to map the Ir L beta 2 X-ray emission lines of IrO2 powder across the Ir L 3-absorption edge, from 11.212 to 11.242 keV with an energy step of 0.3 eV. This work provides a reference for hard X-ray emission spectroscopy experiments utilizing self-seeded pulses with a narrow bandwidth, eventually applicable for pump-probe studies in solid-state and diluted systems.

키워드

X-ray free-electron laser (XFEL)self-seedingresonant X-ray emission spectroscopy (RXES)von Hamos spectrometerFREE-ELECTRON LASERSYNCHROTRON-RADIATIONSPECTROMETERSCATTERINGEDGEFLUORESCENCEBEAMLINESPECTRADESIGN
제목
Resonant X-ray emission spectroscopy using self-seeded hard X-ray pulses at PAL-XFEL
저자
Choi, Tae-KyuPark, JaekuKim, GyujinJang, HoyoungPark, Sang-YounSohn, Jang HyeobCho, Byoung IckKim, HyunjungKim, Kyung SookNam, InhyukChun, Sae Hwan
DOI
10.1107/S1600577523007312
발행일
2023-11
유형
Article
저널명
Journal of Synchrotron Radiation
30
PART 6
페이지
1038 ~ 1047