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Young's modulus of ZnO microwires determined by various mechanical measurement methods
- Kim, Hakseong;
- Jung, Un Seok;
- Kim, Soo In;
- Yoon, Duhee;
- Cheong, Hyeonsik;
- 외 2명
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18초록
The mechanical properties of ZnO microwires have been studied using three different methods: quasistatic flexural measurements using atomic force microscopy, static measurements using a nano indenter, and dynamic flexural measurements using optical interferometry. ZnO microwires were synthesized by chemical vapor deposition method, and the crystal structure and quality were examined using x-ray diffraction and photoluminescence spectroscopy. The Young's moduli were estimated using the measurement results from the three methods, and they showed consistent values in the range 67.5-79.4 GPa for microwires with diameters of 1.8 mu m +/- 100 nm. (C)2013 Elsevier B.V. All rights reserved.
키워드
ZnO microwire; Young's modulus; Nano indentation; Atomic force microscope; Optical interferometry; ZINC-OXIDE NANOSTRUCTURES; NANOWIRES; GROWTH; TEMPERATURE; RESONANCE; NANORODS
- 제목
- Young's modulus of ZnO microwires determined by various mechanical measurement methods
- 저자
- Kim, Hakseong; Jung, Un Seok; Kim, Soo In; Yoon, Duhee; Cheong, Hyeonsik; Lee, Chang Woo; Lee, Sang Wook
- 발행일
- 2014-02
- 유형
- Article
- 권
- 14
- 호
- 2
- 페이지
- 166 ~ 170