Investigation of Self-Assembled Monolayers by Using a Scanning Probe Microscope

Melikyan, Harutyun; Enkhtur, Lkhamsuren; Sargsyan, Tigran; Kim, Seungwan; Babajanyan, Arsen; Kim, Jonkchel; Lee, Kiejin

doi:10.3233/978-1-60750-023-0-107

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Investigation of Self-Assembled Monolayers by Using a Scanning Probe Microscope

Melikyan, Harutyun;
Enkhtur, Lkhamsuren;
Sargsyan, Tigran;
Kim, Seungwan;
Babajanyan, Arsen;
외 2명

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초록

A scanning probe microscope (SPM) technique has been used to investigate the material properties of self-assembled monolayers (SAMs) on gold. We demonstrate that SPM can achieve contactless detection of the thickness of SAMs. By measuring the reflection coefficient S-11 at an operating frequency near 5.3 GHz, we could observe the thickness of SAMs. This nano-scale measurement of SAMs has a great potential for investigating the surface profile with high sensitivity.

키워드

Self assembled monolayer; probe scanning; microscope; reflection coefficient S-11; GOLD

제목: Investigation of Self-Assembled Monolayers by Using a Scanning Probe Microscope

저자: Melikyan, Harutyun; Enkhtur, Lkhamsuren; Sargsyan, Tigran; Kim, Seungwan; Babajanyan, Arsen; Kim, Jonkchel; Lee, Kiejin

DOI: 10.3233/978-1-60750-023-0-107

발행일: 2009

유형: Proceedings Paper

저널명: Studies in Applied Electromagnetics and Mechanics

권: 32

페이지: 107 ~ 112