Investigation of CdS thin films by a near-field microwave microprobe

Sargsyan, Tigran; Hovsepyan, Artur; Melikyan, Harutyun; Yoon, Youngwoon; Lee, Huneung; Babajanyan, Arsen; Kim, Mijung; Cha, Deokjoon; Lee, Kiejin

doi:10.1016/j.ultramic.2008.04.066

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Investigation of CdS thin films by a near-field microwave microprobe

Sargsyan, Tigran;
Hovsepyan, Artur;
Melikyan, Harutyun;
Yoon, Youngwoon;
Lee, Huneung;
외 4명

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초록

Cadmium sulphide (CdS) thin films with different microstructures and morphologies were measured by using a near-field microwave microprobe (NFMM). The NFMM system was coupled to a dielectric resonator with a distance regulation system at an operating frequency f = 4.1 GHz. The changes in dielectric permittivity of CdS thin films due to different annealing temperatures were investigated by measuring the reflection coefficient S, I. US thin films with different microstructures and morphology were characterized by X-ray diffraction, atomic force microscopy and NFMM. (C) 2008 Elsevier B.V. All rights reserved.

키워드

near-field; microwave microprobe; US; annealing; MICROSCOPE; PROBE

제목: Investigation of CdS thin films by a near-field microwave microprobe

저자: Sargsyan, Tigran; Hovsepyan, Artur; Melikyan, Harutyun; Yoon, Youngwoon; Lee, Huneung; Babajanyan, Arsen; Kim, Mijung; Cha, Deokjoon; Lee, Kiejin

DOI: 10.1016/j.ultramic.2008.04.066

발행일: 2008-09

유형: Article; Proceedings Paper

저널명: Ultramicroscopy

권: 108

호: 10

페이지: 1062 ~ 1065