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초록
A model of a near field scanning microwave microscope has been investigated via numerical simulation using the finite element method. Despite being simplified so as to be axially symmetric, the model is in qualitative agreement with measurements on non-conducting samples. As well as frequency shifts, the reflection coefficient S-11 has been calculated as a function of frequency with no adjustable parameters.
키워드
near-field; microwave; reflection coefficient; microwave microscopy
- 제목
- A finite element model of near-field scanning microwave microscopy
- 저자
- Friedman, Barry; Oetiker, Brian; Lee, Kiejin
- 발행일
- 2008-03
- 유형
- Article
- 권
- 52
- 호
- 3
- 페이지
- 588 ~ 594