Near-field scanning microscopy using a resonant waveguide probe at millimeter wavelengths

초록

We demonstrated a millimeter-wave surface imaging technique using a near-field scanning millimeter-wave microscope with a resonant standard waveguide probe. The metallic probe-tip in the resonant waveguide was designed to couple energy into and out of the resonant waveguide. By measuring the shift of resonant frequency and the change of quality factor in the near-field zone, we obtained millimeter-wave near-field images of YBa2Cu3Oy thin films on MgO substrates with a spatial resolution better than 2 mum.

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