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Density Profiles of Liquid/Vapor Interfaces Away from Their Critical Points
- Bu, Wei;
- Kim, Doseok;
- Vaknin, David
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9초록
We examine the applicability of various model profiles for the liquid/vapor interface by X-ray reflectivities on water and ethanol and their mixtures at room temperature. Analysis of the X-ray reflecivities using various density profiles shows an error-function like profile is the most adequate within experimental error. Our findings, together with recent observations from simulation studies on liquid surfaces, strongly suggest that the capillary-wave dynamics shapes the interfacial density profile in terms of the error function.
키워드
X-RAY REFLECTIVITY; CAPILLARY WAVES; VAPOR INTERFACE; FREE-ENERGY; SURFACE; FLUCTUATIONS; SCATTERING; THICKNESS
- 제목
- Density Profiles of Liquid/Vapor Interfaces Away from Their Critical Points
- 저자
- Bu, Wei; Kim, Doseok; Vaknin, David
- 발행일
- 2014-06-12
- 유형
- Article
- 권
- 118
- 호
- 23
- 페이지
- 12405 ~ 12409