상세 보기
Harnessing chaotic bifurcation in positive feedback transistors for secure and scalable random key generation
- Im, Jiseong;
- Ko, Jonghyun;
- Im, Jisung;
- Hwang, Joon;
- Koo, Ryun Han;
- ... Kim, Jangsaeng;
- 외 4명
WEB OF SCIENCE
0SCOPUS
0초록
In the era of big data, robust data security is more critical than ever. One promising way to create unpredictable random keys is to use the intrinsic physical randomness of electronic devices. However, controlling and reproducing this randomness remains a significant challenge. For the first time, we reveal a parabolic input-output relationship enabled by the band-to-band tunneling (BTBT) mechanism in a positive feedback transistor (PFT). By applying iterative operations, we observe chaotic bifurcation behavior, which allows the stable generation of analog random values across more than 1010 cycles. These random values are then used to encrypt and decrypt images, showcasing how encryption technologies can be implemented with just a single PFT. We also show that the charge-trap flash memory (CTF) array integrated with the PFTs can store encrypted information. This study highlights the potential of PFTs as random key generators and examines the device's behavior under chaotic conditions. By leveraging the physical characteristics of the device, we provide a secure and reliable method for data encryption.
키워드
- 제목
- Harnessing chaotic bifurcation in positive feedback transistors for secure and scalable random key generation
- 저자
- Im, Jiseong; Ko, Jonghyun; Im, Jisung; Hwang, Joon; Koo, Ryun Han; Park, Sung Ho; Kim, Jangsaeng; Shin, Wonjun; Woo, Sung Yun; Lee, Jong Ho
- 발행일
- 2025-11
- 유형
- Article
- 권
- 16
- 호
- 1