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초록
We report the changes of the microwave reflection coefficients S11 of copper(II)-phthalocyanine (CuPc) thin films by using a near-field microwave microscope(NSMM) in order to understand the phase transition of CuPc. For a NSMM system, a high-quality microstrip resonator coupled with a dielectric resonator was used. CuPc thin films were prepared on the pre-heated glass substrates using a thermal evaporation method. The reflection coefficients S11 of CuPc thin films were changed by the dependence on the substrate pre-heating temperatures. By comparing reflection coefficient S11 and crystal structures, we found the phase transition of CuPc thin films from α-phase to β-phase at the substrate heating temperature 200 ℃.
키워드
Near-field scanning microwave microscope(NSMM); Reflection coefficient S11; X-ray diffraction; Copper(II)-phthalocyanine thin film; Phase transition; Scanning electron microscope1. 서 론攀1. 서강대학교 물리학과(서울시 마포구 신수동1)2. 군산대학교 물리학과3. 대진대학교 물리학과 a. Corresp; Near-field scanning microwave microscope(NSMM); Reflection coefficient S11; X-ray diffraction; Copper(II)-phthalocyanine thin film; Phase transition; Scanning electron microscope1. 서 론攀1. 서강대학교 물리학과(서울시 마포구 신수동1)2. 군산대학교 물리학과3. 대진대학교 물리학과 a. Corresp
- 제목
- 근접장 마이크로파 현미경을 이용한 Copper(II)-phthalocyanine의 Phase Transition 연구
- 제목 (타언어)
- Study of Phase Transition of Copper(II)-phthalocyanine using a Near Field Scanning Microwave Microscope
- 저자
- 박미화; 임은주; 이기진; 차덕준; 이용산; 유현준; 윤순일
- 발행일
- 2004-06
- 저널명
- 전기전자재료학회논문지
- 권
- 17
- 호
- 6
- 페이지
- 641 ~ 646