Direct Nano-spatial Magnetic Domain Imaging with a Near-field Scanning Microwave Microscope Incorporating an AFM Cantilever Probe

초록

A near-field scanning microwave microscope (NSMM) system incorporating an atomic force microscope (AFM) cantilever probe tip was used for the direct imaging of magnetic domains The NSMM images of domain were obtained by measuring the microwave reflection coefficient S-11 at an operating frequency near 4.1 GHz and were compared with the magnetic force microscope (MFM) image. The AFM cantilever probe tip with the NSMM coupled to the tuning fork distance control system provided nano-spatial resolution. The NSMM incorporating an AFM tip offers a reliable means for quantitatively measuring of magnetic domains with nano-scale resolution and high sensitivity

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