Characterization of Alq3 thin films by a near-field microwave microprobe

Hovsepyan, Artur; Lee, Huneung; Sarpyan, Tigran; Melikyan, Harutyun; Yoon, Youngwoon; Babajanyan, Arsen; Friedman, Barry; Lee, Kiejin

doi:10.1016/j.ultramic.2008.04.013

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Characterization of Alq3 thin films by a near-field microwave microprobe

Hovsepyan, Artur;
Lee, Huneung;
Sarpyan, Tigran;
Melikyan, Harutyun;
Yoon, Youngwoon;
외 3명

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4

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4

초록

We observed tris-8-hydroxyquinoline aluminum (Alq3) thin films dependence on Substrate heating temperatures by using a near-field microwave microprobe (NFMM) and by optical absorption at wavelengths between 200 and 900nm. The changes of absorption intensity at different Substrate heating temperatures are correlated to the changes in the sheet resistance of Alq3 thin films. (C) 2008 Elsevier B.V. All rights reserved.

키워드

near field; microwave microprobe; Alq3; heating; absorption

제목: Characterization of Alq3 thin films by a near-field microwave microprobe

저자: Hovsepyan, Artur; Lee, Huneung; Sarpyan, Tigran; Melikyan, Harutyun; Yoon, Youngwoon; Babajanyan, Arsen; Friedman, Barry; Lee, Kiejin

DOI: 10.1016/j.ultramic.2008.04.013

발행일: 2008-09

유형: Article; Proceedings Paper

저널명: Ultramicroscopy

권: 108

호: 10

페이지: 1058 ~ 1061