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초록
We investigated surface potential profiles for pentacene films as a function of the film thickness and the contact metallurgy (Au and Al) by using a near-field microwave microprobe analysis and Kelvin-probe force microscopy. The surface potential for the Al/pentacene bilayers increased monotonically with the thickness of pentacene while no thickness dependence of the surface potential was for the Au/pentacene bilayers. These results are discussed based on the potential barrier at the metal/pentacene interface due to the space charge.
키워드
pentacene; near-field microwave microscope; Kelvin-probe method; reflection coefficient; surface potential
- 제목
- Surface potential of pentacene films and contact metallurgy for organic-based electronic applications
- 저자
- Lee, Kiejin; Kim, Tae Hee
- 발행일
- 2006-12
- 유형
- Letter
- 권
- 49
- 호
- 6
- 페이지
- L2226 ~ L2229