상세 보기
초록
A near-field scanning microwave microscope (NSMM) is used to study the physical properties of DNA strands with a specific sequence and image lamda-DNA bundles. After the hybridization process between target and capture sequences, specific DNA binding events leads to microwave reflection coefficient (Sli) changes of the NSMM. These changes are caused by a modification of the physical dielectric constant due to sequence specific DNA binding. This study demonstrates significant potential of the NSMM as a nondestructive and noncontact tool to detect DNA strands without a target-probe amplification process and as a valuable technique to understand the physical property of DNA.
키워드
near-field; DNA; noncontact; nondestructive; label-free; near-field scanning mcrowave microscope; diagnostics
- 제목
- Label-free DNA detection using a near-field microwave
- 저자
- Lee, Kiejin; Babajayan, Arsen; Kim, Songhui
- 발행일
- 2006
- 유형
- Article; Proceedings Paper
- 권
- 321-323
- 페이지
- 1040 ~ 1043