Label-free DNA detection using a near-field microwave

  • Lee, Kiejin
  • Babajayan, Arsen
  • Kim, Songhui
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초록

A near-field scanning microwave microscope (NSMM) is used to study the physical properties of DNA strands with a specific sequence and image lamda-DNA bundles. After the hybridization process between target and capture sequences, specific DNA binding events leads to microwave reflection coefficient (Sli) changes of the NSMM. These changes are caused by a modification of the physical dielectric constant due to sequence specific DNA binding. This study demonstrates significant potential of the NSMM as a nondestructive and noncontact tool to detect DNA strands without a target-probe amplification process and as a valuable technique to understand the physical property of DNA.

키워드

near-fieldDNAnoncontactnondestructivelabel-freenear-field scanning mcrowave microscopediagnostics
제목
Label-free DNA detection using a near-field microwave
저자
Lee, KiejinBabajayan, ArsenKim, Songhui
DOI
10.4028/www.scientific.net/KEM.321-323.1040
발행일
2006
유형
Article; Proceedings Paper
저널명
Key Engineering Materials
321-323
페이지
1040 ~ 1043