Direct imaging of conductivity in pentacene field-effect transistors by a near-field scanning microwave microprobe

초록

A near-field scanning microwave microprobe (NSMM) is employed to visualize the carrier distribution in the active layer of an organic field-effect transistor (OFET). Experiments using this technique with a pentacene OFET reveal changes of the conductivity profiles in the channel which arise from the development and exhaustion of an accumulated charge region. Electric field profiles that are visualized by using the electric field induced optical second harmonic generation (EFISHG) method, verify the results. NSMM is a powerful tool, and in combination with EFISHG will provide a way to directly probe carrier transport. (C) 2010 Elsevier B.V. All rights reserved.

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