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Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy
- Nam, Dahyun;
- Opanasyuk, A. S.;
- Koval, P. V.;
- Ponomarev, A. G.;
- Jeong, Ah Reum;
- ... Cheong, Hyeonsik;
- 외 2명
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34초록
Compositional and structural studies of Cu2ZnSnSe4 (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by co-evaporation. The composition of the films measured by two different methods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro-PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample. (C) 2014 Elsevier B.V. All rights reserved.
키워드
Copper-zinc-tin selenide; Thin films; X-ray diffraction; Energy dispersive X-ray spectroscopy; Raman spectroscopy; Confocal microscopy; Particle induced X-ray emission; Photoluminescence; SOLAR-CELL; GROWTH
- 제목
- Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy
- 저자
- Nam, Dahyun; Opanasyuk, A. S.; Koval, P. V.; Ponomarev, A. G.; Jeong, Ah Reum; Kim, Gee Yeong; Jo, William; Cheong, Hyeonsik
- 발행일
- 2014-07-01
- 유형
- Article
- 저널명
- Thin Solid Films
- 권
- 562
- 페이지
- 109 ~ 113
- 언어
- ENG
- 출판사
- Elsevier Sequoia
- 발행국가
- 스위스
- 분량
- 5 페이지
- ISSN
- P 0040-6090