상세 보기
Analysis of hump characteristics induced by band-to-band tunneling in floating-body n-MOSFET with ultra-shallow source/drain junction depth
- 제목
- Analysis of hump characteristics induced by band-to-band tunneling in floating-body n-MOSFET with ultra-shallow source/drain junction depth
- 저자
- 김시현
- 발행일
- 2024-07-09
- 학회명
- 2024 ASIA-PACIFIC WORKSHOP ON ADVANCED SEMICONDUCTOR DEVICES (AWAD 2024)