Fabrication of Silicon Nanowire for Detecting β-Amyloid (1-42) by Nanoimprint Lithography

  • Choi, Dong-Sik
  • Lee, Jin-Ho
  • Jung, Hee-Soo
  • Jung, Gun-Young
  • Choi, Jae-Hak
  • ... Oh, Byung-Keun
  • 외 1명
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초록

Ultraviolet nanoimprint lithography (UV-NIL) is a high volume and cost-effective patterning technique with sub-10 rim resolution. It has great potential as a candidate for next generation lithography. Using UV-NIL, nanowire patterns were successfully fabricated on a four-inch silicon-on-insulator (SOI) wafer under moderate conditions. The fabricated nanowire patterns were characterized by FE-SEM. Its electrical properties were confirmed by semiconductor parameter analysis. Monoclonal antibodies against beta-amyloid (1-42) were immobilized on the silicon nanowire using a chemical linker. Using this fabricated silicon nanowire device, beta-amyloid (1-42) levels of 1 pM to 100 nM were successfully determined from conductance versus time characteristics. Consequently, the nanopatterned SOI nanowire device can be applied to bioplatforms for the detection of proteins.

키워드

Nanoimprint LithographySilicon Nanowire PatternSilicon-on-Insulator (SOI)NanobiosensorIMPRINTDNA
제목
Fabrication of Silicon Nanowire for Detecting β-Amyloid (1-42) by Nanoimprint Lithography
저자
Choi, Dong-SikLee, Jin-HoJung, Hee-SooJung, Gun-YoungChoi, Jae-HakChoi, Jeong-WooOh, Byung-Keun
DOI
10.1166/jnn.2011.3634
발행일
2011-05
유형
Article; Proceedings Paper
저널명
Journal of Nanoscience and Nanotechnology
11
5
페이지
4517 ~ 4521