Structure and ferroelectric properties of epitaxial (1-x) BiFeO3-xBaTiO3 solid solution films

초록

We fabricated epitaxial (1-x) BiFeO(3)-xBaTiO(3) (x = 0.1-0.7) solid solution films on niobium doped SrTiO(3)(001) substrate. The x-ray diffraction analysis of the films indicates compressively strained growth for the composition x < 0.3 and strain relaxed growth for the composition x >= 0.3. Correspondingly, the films showed a structural change from a rhombohedral (or modified monoclinic MA) phase to a tetragonal phase near the composition x similar to 0.3. Interestingly the ferroelectric measurements showed a distinct difference between the compositions, with the boundary at x similar to 0.3, above which the films remain in a highly resistive state. The magnetic measurements revealed a weak ferromagnetic signature for the films of composition x <= 0.5.

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