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Negative Thermal Expansion Coefficient of Graphene Measured by Raman Spectroscopy
- Yoon, Duhee;
- Son, Young-Woo;
- Cheong, Hyeonsik
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969초록
The thermal expansion coefficient (TEC) of single-layer graphene is estimated with temperature-dependent Raman spectroscopy in the temperature range between 200 and 400 K. It is found to be strongly dependent on temperature but remains negative in the whole temperature range with a room temperature value of (-8.0 +/- 0.7) x 10(-6) K-1. The strain caused by the TEC mismatch between graphene and the substrate plays a crucial role in determining the physical properties of graphene, and hence its effect must be accounted for in the interpretation of experimental data taken at cryogenic or elevated temperatures.
키워드
Graphene; Raman spectroscopy; thermal expansion coefficient; strain; TEMPERATURE; GRAPHITE; CONDUCTIVITY; DEPENDENCE; TRANSPORT; SPECTRUM
- 제목
- Negative Thermal Expansion Coefficient of Graphene Measured by Raman Spectroscopy
- 저자
- Yoon, Duhee; Son, Young-Woo; Cheong, Hyeonsik
- 발행일
- 2011-08
- 유형
- Article
- 저널명
- Nano Letters
- 권
- 11
- 호
- 8
- 페이지
- 3227 ~ 3231