상세 보기
Scanning probe microscopy studies of novel ferroelectricity in HfO2 thin films and twisted van der Waals bilayers
- 제목
- Scanning probe microscopy studies of novel ferroelectricity in HfO2 thin films and twisted van der Waals bilayers
- 저자
- 양상모
- 발행일
- 2023-08-10
- 학회명
- 제14회 응용물리심포지엄