Surface measurement of microstructures using optical pick-up based scanner

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Surface measurement of microstructures using optical pick-up based scanner
저자
Kim, Jae-HyunPark, Jung-YulLee, Seung-Yop
DOI
10.3795/KSME-B.2010.34.1.73
발행일
2010
유형
Article
저널명
대한기계학회논문집 B
34
1
페이지
73 ~ 76