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Analysis of interface trap density in metal-ferroelectric-insulator-semiconductor (MFIS) capacitor with high-k dielectrics
- 제목
- Analysis of interface trap density in metal-ferroelectric-insulator-semiconductor (MFIS) capacitor with high-k dielectrics
- 저자
- 김시현
- 발행일
- 2024-01-25
- 학회명
- 제 31회 한국반도체학술대회