Analysis of the elemental composition of Cu2ZnSnSe4 films by the PIXE and μ-PIXE methods

초록

By X-ray characteristic radiation induced by focused proton beam, the distribution of compound components over the area of Cu<inf>2</inf>ZnSnSe<inf>4</inf> (μ-PIXE) films is investigated and their elemental composition (PIXE) is determined. Nuclear scanning microprobe with the proton beam energy of 1,5 MeV and the transverse dimension of the probe of 4 × 4 μm2 was used for the method realization. Films of fourcomponent compound were obtained under different physical and technological deposition modes by the thermal co-evaporation of the components using electron-beam gun. Sodium glass with molybdenum sublayer heated to 400°C was used as the substrate. As a result of investigations it was established that the distribution of elements over the film area is homogeneous and their composition is determined by physical and technological conditions of preparation. © 2014.

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