Range-Scaled 14b 30 MS/s Pipeline-SAR Composite ADC for High-Performance CMOS Image Sensors

  • Park, Jun-Sang
  • Jeong, Jong-Min
  • An, Tai-Ji
  • Ahn, Gil-Cho
  • Lee, Seung-Hoon
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초록

This paper proposes a low-power range-scaled 14b 30 MS/s pipeline-SAR composite ADC for high-performance CIS applications. The SAR ADC is employed in the first stage to alleviate a sampling-time mismatch as observed in the conventional SHA-free architecture. A range-scaling technique processes a wide input range of 3.0V(P-P) without thick-gate-oxide transistors under a 1.8 V supply voltage. The first-and second-stage MDACs share a single amplifier to reduce power consumption and chip area. Moreover, two separate reference voltage drivers for the first-stage SAR ADC and the remaining pipeline stages reduce a reference voltage disturbance caused by the high-speed switching noise from the SAR ADC. The measured DNL and INL of the prototype ADC in a 0.18 mu m CMOS are within 0.88 LSB and 3.28 LSB, respectively. The ADC shows a maximum SNDR of 65.4 dB and SFDR of 78.9 dB at 30 MS/s, respectively. The ADC with an active die area of 1.43 mm(2) consumes 20.5 mW at a 1.8 V supply voltage and 30 MS/s, which corresponds to a figure-of-merit (FOM) of 0.45 pJ/conversion-step.

키워드

Analog-to-digital converter (ADC)range-scalingwide input rangepipeline-SARseparate referenceCALIBRATION
제목
Range-Scaled 14b 30 MS/s Pipeline-SAR Composite ADC for High-Performance CMOS Image Sensors
저자
Park, Jun-SangJeong, Jong-MinAn, Tai-JiAhn, Gil-ChoLee, Seung-Hoon
DOI
10.5573/JSTS.2016.16.1.070
발행일
2016-02
유형
Article
저널명
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
16
1
페이지
70 ~ 79