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Chemical depth profile of passive oxide on stainless steel
- Kim, DH;
- Lee, HH;
- Kim, SS;
- Kang, HC;
- Noh, DY;
- ... Kim, H;
- 외 1명
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The chemical depth profile of the passive oxides formed on a stainless-steel surface (type 430, Fe-16.3%Cr) in pH 8.4 borate solution was obtained quantitatively by in situ anomalous x-ray reflectivity. The passive film consists of a Cr oxide inner layer and a Fe/Cr oxide outer layer. The absence of Fe oxide underneath Cr oxide indicates that Cr oxide provides the passivity in stainless steel by inhibiting oxygen anion diffusion. The oxide grows by limited metallic cation transfer. The passivity breaks down in transpassive regime due to the oxidation of the Cr oxide to a soluble oxide. (C) 2004 American Institute of Physics.
키워드
X-RAY-REFLECTIVITY; FILM; SURFACE; CR
- 제목
- Chemical depth profile of passive oxide on stainless steel
- 저자
- Kim, DH; Lee, HH; Kim, SS; Kang, HC; Noh, DY; Kim, H; Sinha, SK
- 발행일
- 2004-12-27
- 유형
- Article
- 권
- 85
- 호
- 26
- 페이지
- 6427 ~ 6429